Navigation

Produktentwicklung Integrierter Systeme (Analog/Mixed-Signal)

Lecturers

Details

Time and place:

  • Fri 10:15-11:45, Room EL 4.14

Fields of study

  • WF ME-BA from SEM 5
  • WF EEI-BA-MIK from SEM 5
  • WF EEI-MA from SEM 1
  • WF ICT-MA from SEM 1
  • WF ME-MA from SEM 1

Content

  • Why analog?

  • Introduction: Development Flow of an IC

  • Quality Control Environments

  • ATE Architecture

  • Analog Instruments

  • Basic Analog Measurement and Test Concepts (DC)

  • DAC testing

  • Data Analysis and Statistics

  • Sampling Theory and DSP-based Testing

  • ADC Testing

  • Design for Test

  • Typical Analog Issues / Pitfalls

  • RF Testing

  • Qualification of ICs

  • Failure Analysis of ICs


Additional information

Expected participants: 20

www: https://www.studon.fau.de/studon/goto.php?target=cat_1356236