UnivIS

Produktentwicklung Integrierter Systeme (Analog/Mixed-Signal)

Lecturers

Details

Time and place

  • Fry 10:15-11:45, Room EL 4.14 (exclude vac) ICS

Content

- Why analog? - Introduction: Development Flow of an IC - Quality Control Environments - ATE Architecture - Analog Instruments - Basic Analog Measurement and Test Concepts (DC) - DAC testing - Data Analysis and Statistics - Sampling Theory and DSP-based Testing - ADC Testing - Design for Test - Typical Analog Issues / Pitfalls - RF Testing - Qualification of ICs - Failure Analysis of ICs (automatisch geplant, erwartete Hörerzahl original: 20, fixe Veranstaltung: nein)

Additional information

www: https://www.studon.fau.de/studon/goto.php?target=cat_1356236